Collection of SEM micrographs showing FIB-fabricated Magnesium micropillars after compression

SEM micrographs of Mg micropillars fabricated by focused ion beam (FIB) milling and deformed by microcompression using a flat punch indenter. The dataset includes monocrystalline pillars imaged after testing using an FEI Dual-Beam-FIB FEI Helios Nanolab 600i. The data used in this publication was managed using the framework and metadata scheme provided by project A07 within SFB1394 Structural and Chemical Atomic Complexity — From Defect Phase Diagrams to Material Properties, project ID 409476157 funded by the Deutsche Forschungsgemeinschaft (DFG) and using the research data management platform Coscine (http://doi.org/10.17616/R31NJNJZ) with storage space of the Research Data Storage (RDS) (DFG: INST222/1261-1) and DataStorage.nrw (DFG: INST222/1530-1) granted by the DFG and Ministry of Culture and Science of the State of North Rhine-Westphalia.