PLC CWDM Chip Test Measurements

This dataset contains 16,501,626 records from chip-level testing of 2,790 wafers used in CWDM planar lightwave circuit (PLC) devices. Each record corresponds to a specific chip and test parameter, with five total measurements per test: four per-channel values (channel_1 to channel_4) and one spatial mean (parameter_value). This results in over 82 million total measurement values across all chips.

Chip metadata includes wafer_name, wafer_region, row, column, and chip_location, along with test type, parameter category, and scope. Parameters cover optical properties such as insertion loss (IL), axis alignment (AX/NAX), and polarization behavior.

Temporal alignment is handled using date_idx and event bounds (min_date_idx, max_date_idx), enabling correlation with fabrication conditions.

This dataset supports spatiotemporal yield modeling, failure analysis, and fabrication-to-test traceability.