Dataset - Recombination and Resistive Losses of Transferred Foil Contacts for Silicon Heterojunction Solar Cells

This dataset contains contact resistivity, contact recombination and reflectance data associated with the following publication. In this work, a novel low-cost approach to fabricate metal contacts for silicon heterojunction solar cells, called the transferred foil contact, is presented using aluminium foils with silver-based electrically conductive adhesive (ECA) pastes. The extended transfer length method (TLM) measurement technique is used to calculate the contact resistivity values. The contact recombination values were obtained by applying intensity-dependent photoluminescence (PL) imaging and subsequent multivariate regression analysis with finite element method (FEM) simulation called Griddler AI. Reflectance was measured using a quantum efficiency (QE) measurement system. <br>Iqbal, N., Li, M., Gregory, G., Dahal, S., Bowden, S. &amp; Davis, K.O. Recombination and Resistive Losses of Transferred Foil Contacts for Silicon Heterojunction Solar Cells. physica status solidi (RRL) – Rapid Research Letters (2020). doi:10.1002/pssr.202000368<br>