XEOL/μLaue mapping of GaN μplatelets

A new method to controll the structural and optical quality of GaN platelets has been proposed. Here, we want to map their strain and structural defects by μLaue as
well as disorientations, and to correlate these results to the GaN near-band edge emission measured by XEOL . It will provide a clear view of the impact of the
geometrical parameters of the different pattern geometries and validate the general approach by giving new structural information. A multiscale analysis is necessary
on single patterns to study intra-coalescence of sub-grains and between the single patterns (inter-coalescence). A statistical view will be also of high interest to
understand the scalability of the process (scanning tens of μm2).