Scanning transmission electron microscopy data of polymer blend semiconductors F8:F8BT

Datasets including low-dose nanobeam electron total scattering (scanning electron diffraction or SED, also denoted four-dimensional scanning transmission electron microscopy or 4D-STEM) and electron energy loss spectroscopy obtained from polymer blend films comprising poly(9,9-di-n-octylfluorenyl-2,7-diyl) (F8) and poly(9,9-dioctylfluorene-alt-benzothiadiazole) (F8BT). Data also includes SED from cross-sections of device stack models comprising glass/indium tin oxide/PEDOT:PSS/F8:F8BT/Pt (capping) prepared by focused ion beam (with cryogenic cooling during thinning). Details of the acquisition conditions and methods are included in the associated publication: https://doi.org/10.1002/smtd.70719. A list of all files and corresponding figures is given in the file "FileList.txt". The files are supplied in HDF5 file formats readable using the HyperSpy Python package (https://hyperspy.org/index.html) in DM4 file formats saved by the Gatan Microscopy Suite (https://www.gatan.com/products/tem-analysis/digitalmicrograph-software). The HDF5 files are provided as processed in the accompanying manuscript. Following acquisition on a Merlin Medipix detector with an area corresponding to 515×515 pixels, the data were cropped to 514×514 pixels re-binned by a factor of two to 257×257 pixels in the diffraction plane. The DM4 files are provided as saved at time of acquisition, with gain and dark reference corrections applied. The DM4 files for electron energy loss spectroscopy (Figures S17-S18) and calibration datasets for SED are included in ZIP folders where multiple records are grouped by corresponding figure and purpose in the accompanying manuscript.