X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...

XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on...X射线荧光光谱（XRF）测试采用Elio设备，参数设置为40千伏、80微安，单次单点测量时长为120秒；反射成像检测采用DinoLite设备，针对油墨与颜料斑点采用50倍放大倍率，针对……斑点则采用200倍放大倍率。