Supplmentary material
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资源简介：
The supplemental material contains SEM and EDAX Analysis, Core-level Photoemission Spectra, Raman Spectroscopy and ARPES spectra acquired using vertical polarization of light. The tables summarize the parameters obtained from Rietveld refinement of the Powder XRD data and the fitting parameters of the Ta 4f core-level spectra.
创建时间：
2025-12-15
