Characterization of minimum material requirements for high-speed X-ray diffra...

Exploiting X-ray diffraction microscopy (XDM), this proposal aims at extending our physical description of the wave behavior in a Surface Acoustic Wave (SAW) device. The...本提案采用X射线衍射显微术（X-ray diffraction microscopy, XDM），旨在深化对表面声波（Surface Acoustic Wave, SAW）器件内声波行为的物理描述。该...