Effect of Chemical Post-Processing on Surfaces and Sub-Surface Defects in Electron Beam Melted Ti-6Al-4V.
收藏Mendeley Data2026-04-09 收录
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资源简介：
The data consists of the unprocessed (RAW) XCT files for the square bars specimens as well as interferometry files and all microscopy images (SEM and Optical). No closer sorting has been made but most data should be self-explanatory.
提供机构：
Viktor Sandell
