Automated Grain Boundary Detection via U-Net: Images
收藏DataCite Commons2025-07-25 更新2026-04-25 收录
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https://columbia.redivis.com/datasets/ezwc-6yhc9b71p
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资源简介：
This repository contains the images used for the article available at:
https://doi.org/10.1093/micmic/ozad115
Please cite as:
MJ Patrick, JK Eckstein, JR Lopez, S Toderas, SA Asher, SI Whang, S Levine, JM Rickman, K Barmak, "Automated Grain Boundary Detection for Bright-Field Transmission Electron Microscopy Images via U-Net", Microsc. Microanal. 29 (2023) 1968–1979, https://doi.org/10.1093/micmic/ozad115
The data here consist of bright-field TEM micrographs of aluminum thin films, hand labels, and automated tracings. The test data was collected on the Columbia Nano Initiative Electron Microscopy's FEI Talos F200X S/TEM.
提供机构：
Redivis
创建时间：
2025-07-18
