Line widths and expanded uncertainties as measured by the NIST traceable micrometer.
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https://figshare.com/articles/dataset/_Line_widths_and_expanded_uncertainties_as_measured_by_the_NIST_traceable_micrometer_/1238303
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资源简介：
Line widths and expanded uncertainties as measured by the NIST traceable micrometer.
创建时间：
2014-11-12
