<strong>Data for publication: Ion-beam deposited platinum as electrical contacting material in operando electron microscopy experiments at elevated temperatures</strong>

This is data presented in the publication "Ion-beam deposited platinum as electrical contacting material in operando electron microscopy experiments at elevated temperatures" Authored by Søren Bredmose Simonsen, Zhongtao Ma, Elisabeth Mariegaard, Salvatore De Angelis, Waynah Lou Dacayan, Kristian Speranza Mølhave, Christodoulos Chatzichristodoulou The Data is TEM and SEM microscopy images, spetroscopy data (EELS and EDS) and tables from electrical measurements. Published in Microscopy Research and Technique, 2023, 1-9.