X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractogr
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractogr
This dataset includes depth profiles of porosity estimated from electrical resistivity logs for six sites (sites C0001, C0002, C0004, C0006, C0012, and C0024) at the Nankai Trough. Depth profiles are
As part of the USGS's California State Waters Mapping Project, a 50-m grid of sediment thickness for the seafloor within the 3-nautical mile limit between Point Sur and Point Arguello was generated fr
