XEOL and µLaue measurements of perovskite monocrystals for X-ray detection: materials and operando photocurrent

We propose to correlate the crystalline quality to the optical emission of CH3NH3PbBr3 hybrid perovskite crystals used for direct X-ray detection. Single crystals will be mapped by µLaue to measure the strain and tilt as well as the XEOL emission to get local and statistical information of the materials with a probe of ~200x200 nm2. Then, a full polarized device will be measured in top-view and cross-section using this small X-ray beam. In the cross-section geometry, the variation of the generated current, Laue diffraction, and light will give access to the photocurrent density as a function of the position of irradiation, and its defect dependence. This study will participate to the development of these devices for medical imaging.