Raw data for manuscript J. Dwivedi et al., Spectro-Microscopy of Individual Pt−Rh Oxidation and Alloying Core−Shell Nanoparticles during Competing Oxidation and Alloying

SEM.zip, AFM.zip and SAM.zip: These compressed folders contain the raw files of high-resolution scanning electron microscopy (SEM), atomic force microscopy (AFM) images, and the Rh Auger map for the selected region of interest (ROI) along with the Auger survey spectra collected at the DESY NanoLab before and after the in situ measurements. The figures compiled from these files correspond to the subfolder names and are presented in the main manuscript (Figure 1, Figure 6) as well as in the supporting information (Figure S2, Figure S4, Figure S6-S8). Detailed measurement conditions can be inferred from the manuscript, the supplementary information and the Figure captions. XPEEM.zip and LEEM.zip: The data files in these compressed folders consist raw data of the X-ray photoemission electron microscopy (XPEEM) and low-energy electron microscopy (LEEM) images collected at the SMART microscope operated at the UE49PGM undulator beamline at BESSY II synchrotron, Helmholtz Zentrum Berlin (HZB) during in situ measurements. LEEM images were taken at a kinetic energy of 5 eV, while XPEEM images of Rh3d, Pt4f, and C1s were obtained at kinetic energies of approximately 70-80 eV, with a field of view of 6.14 μm across all analyzed conditions. The figures generated from these files correspond to the subfolder names and are included in the main manuscript (Figures 2, 3, and 4) as well as the supporting information (Figures S1, Figures S3, Figures S5 and S8). P1-P2-P3_EBSD.crc : This data file is the typical Electron backscatter diffraction map of the region of interest discussed in the manuscript. The map provides information on the crystal orientations in both the in-plane and out-of-plane directions. To obtain these crystal orientation images, we employed electron backscatter diffraction (EBSD) combined with scanning electron microscopy (SEM) utilizing automated indexation of Kikuchi patterns generated through multiple electron Bragg reflections, see e.g., Figure 6, and in the supporting information (Figure S6-S7).