Crystal quality analysis of SAG PbTe/CdTe heteroepitaxy for Majorana quantum bit applications
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https://doi.esrf.fr/10.15151/ESRF-ES-2169732165
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资源简介：
This proposal aims to examine the crystal quality of heteroepitaxial selective area grown (SAG) PbTe on CdTe using molecular beam epitaxy. PbTe is a promising material for detecting Majorana bound states, which are essential for fault-tolerant quantum bits. However, high-quality, low disorder heteroepitaxy is required to achieve this. Scanning X-ray diffraction microscopy at the ID01 beamline will be employed to analyse strain and rotation distributions in PbTe samples. Our findings will address key aspects like mask constriction, crystal reorientation during growth, and lattice mosaicity on the quality of PbTe nanowire networks.
提供机构：
ESRF, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France; Universita di Roma La Sapienza, Dipartimento di Fisica, Piazzale Aldo Moro 5, 00185 , Roma, ITALY; Eindhoven University of Technology, Department of Physics, P O Box 513, 5600 MB, Eindhoven, NETHERLANDS
创建时间：
2028-01-01
