High-definition electron backscatter diffraction patterns of annealed and 10%-rolled AlMg alloys

600 high definition (1140×1600 pixels) diffraction patterns recorded by Bruker EBSD detector for annealed and 10%-rolled AlMg samples are provided, resolved at a step size of 1.62μm and 6.87μm, respectively. The acceleration voltage was 20 kV, the probe current 20 nA, and the dwell time 1 s. These patterns were analyzed in previous publications (https://doi.org/10.1016/j.matchar.2021.111206, https://doi.org/10.1016/j.micron.2021.103081, https://doi.org/10.1016/j.matchar.2023.113022, https://doi.org/10.1016/j.matchar.2024.114508). The full field dislocation density maps for the two scans, estimated by the blurriness of the patterns, are also available.