Supporting information to derive the figures of the paper: "Wafer-scale low-disorder 2DEG in 28Si/SiGe without an epitaxial Si cap"
收藏Mendeley Data2022-12-16 更新2024-06-27 收录
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https://data.4tu.nl/articles/_/19181597
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资源简介：
The data sets provide the necessary information to derive the figures of the paper "Wafer-scale low-disorder 2DEG in 28Si/SiGe without an epitaxial Si cap" Preprint at https://arxiv.org/abs/2202.08090
创建时间：
2022-09-15
