Processed SEM Images of an Electrochemically Modified InP Surface with Microsegmented Morphology for Compliant Buffer Applications

This dataset contains a set of representative, processed scanning electron microscopy (SEM) images of an electrochemically modified indium phosphide (InP) surface engineered to function as a mechanically compliant buffer layer for advanced electronic and optoelectronic heterostructures. The SEM images document the formation of a microtextured, domain-segmented surface morphology resulting from controlled electrochemical surface modification. The observed mosaic-like pattern consists of quasi-polygonal domains separated by narrow boundaries, providing structural decoupling that enables local strain accommodation at the interface. Only selected processed SEM images are included in this dataset. Raw image series, full acquisition parameters, and image calibration procedures are intentionally not disclosed at this stage. The dataset is intended to document the final morphological outcome relevant to the interpretation presented in the associated research study and may be extended in future versions to include additional images or raw data, if appropriate. This dataset supports research on compliant buffer layers, electrochemically modified III–V semiconductor surfaces, and morphology-driven strain management strategies in heterostructure integration. A detailed description of the dataset structure and reuse notes is provided in the accompanying README.md file. Methods Scanning electron microscopy was employed to characterize the surface morphology of the electrochemically modified InP sample. Imaging was performed using a field-emission SEM in secondary electron mode to resolve near-surface microstructural features. The images included in this dataset represent processed results selected to be representative of the modified surface state. Image processing was limited to contrast optimization and format standardization to improve visual clarity and comparability. No artificial segmentation, filtering intended to alter morphology, or quantitative morphometric analysis is included. Detailed instrumental settings, accelerating voltage, working distance, detector configuration, and electrochemical modification parameters are intentionally omitted and may be disclosed in future dataset versions upon completion of the full experimental study. Content of the dataset The dataset includes: A set of processed SEM images of an electrochemically modified InP surface; An image identification table describing each image and its morphological focus; A sample identification table describing the material and surface state. All images are provided in non-proprietary bitmap formats to facilitate inspection and reuse File structure /images SEM_InP_processed_01.bmp SEM_InP_processed_02.bmp SEM_InP_processed_03.bmp SEM_InP_processed_04.bmp SEM_InP_processed_05.bmp SEM_InP_processed_06.bmp /tables sem_image_index.csv samples_sem.csv README.md