Applications of the scattering matrix reconstructed from four dimensional scanning transmission electron microscopy

This thesis considers new ways of exploring the atomic structure of materials using advanced electron microscopy techniques. Recent developments in detector technologies mean we have access to more data than ever before, but also makes analysing said data a challenge. This research focuses on a technique called the scattering matrix, which can be used to analyse specimens where simpler models break down. Through simulation and experiment, this thesis explores various applications of the scattering matrix and develops the technique further. Overall, this work paves the way for future research in atomic-scale structure analysis.