Data for: Formation of Multilayer Cu Islands Embedded beneath the Surface of Graphite: Characterization and Fundamental Insights
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The file contains raw scanning tunneling microscopy (STM) images and x-ray photoelectron spectroscopy (XPS) spectra. To view and process STM images, the user can use a software called WSxM. To view XPS spectra, the program CASA XPS is recommended. The STM and XPS data uploaded herein are used to generate figures in the published paper, which can be found in J. Phys. Chem. C 2018, 122, 4454-4469.<br><b>curation change log</b>: added link to paper; updated title to distinguish from paper; updated funding metadata - MNO<br>
创建时间：
2022-01-31
