Validating x-ray line-profile defect analysis using atomistic models of deformed material
收藏Mendeley Data2024-05-10 更新2024-06-27 收录
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https://zenodo.org/records/6362428
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Data and analysis (scripts and Jupyter notebooks) associated with publications: Validating x-ray line-profile defect analysis using atomistic models of deformed material (submitted to Physical Review Materials) Validation of x-ray line-profile analysis of extended defects in deformed crystals (submitted to Physical Review Letters) Preprints of these papers are included here
创建时间：
2023-06-28
