Fluorescence ceramic xrd, fluorescence spectroscopy, thermoluminescence spectroscopy, macro readout information and related picture data sets

X-ray diffraction (XRD) patterns of samples were measured by using X-ray diffractometer (Bruker D8 ADVANCE) with Cu Kα radiation in the rage of 2θ = 10-90°. The scanning interval is 0.02°, PL and PLE spectra were recorded by Hitachi F-4600 fluorescence spectrophotometer with a 150 W xenon arc lamp as the light source. Thermoluminescence curves (TL) was conducted by SL08 TL meter (Radiation Science and Technology Co. Ltd, Guangzhou, China), using a high-pressure mercury lamp (254 nm) as the excitation source and with a photomultiplier tube detector (PMT; CR105, Beijing Hamamatsu, China). After irradiated by a 254 nm Hg lamp for 5 min and waited for 5 min, the sample was heated to 673 K, and record the TL intensity. Macro reading pictures are taken by mobile phones.