CIGS Experimental and SCAPS Data

This dataset contains simulated and experimental data for CIGS devices with and without RbF post-deposition treatment. The experimental results include full dark and light current-voltage curves from 150K to 350K. It also includes diode parameters calculated from these curves at 300K. The simulated results include SCAPS simulated Voc values over a range of defect concentrations for the Ev+0.58eV, Ev+0.98eV, and bandtail defects.