各向异性磁电阻薄膜电输运性能及微结构研究

各向异性磁电阻薄膜电输运性能及微结构研究数据集主要面向Ta/MgONiFe/MgO/Ta薄膜界面附近的电子结构以及对薄膜电输运性能的影响及机理研究，打破国外高性能AMR磁传感器的技术垄断。数据通过综合物性测量系统、透射电子显微镜、X射线光电子能谱、X射线吸收谱等测试方法产生。主要包括磁电阻值、传感器元件的灵敏度、噪音、薄膜样品的微观结构电镜图和界面电子结构相关数据，数据量3.98MB。Dataset for Research on Electrical Transport Properties and Microstructure of Anisotropic Magnetoresistance Thin Films. This dataset is primarily intended for studies on the electronic structure near the Ta/MgONiFe/MgO/Ta thin film interface, its impact on the electrical transport properties of thin films and the underlying mechanism, aiming to break the technological monopoly of foreign high-performance AMR magnetic sensors. The data is generated through multiple characterization techniques including the Physical Property Measurement System (PPMS), Transmission Electron Microscopy (TEM), X-ray Photoelectron Spectroscopy (XPS), and X-ray Absorption Spectroscopy (XAS). It mainly covers magnetoresistance values, sensitivity and noise of sensor components, electron microscopy images of the microstructure of thin film samples, and data related to the interfacial electronic structure, with a total data size of 3.98 MB.

搜集汇总

背景与挑战

背景概述

该数据集聚焦于各向异性磁电阻（AMR）薄膜的电输运性能与微观结构研究，旨在探究Ta/MgO/NiFe/MgO/Ta薄膜界面电子结构及其对电输运性能的影响机制，以突破国外高性能AMR磁传感器的技术垄断。数据通过综合物性测量系统、透射电镜、X射线光电子能谱等多种测试方法获取，包含磁电阻值、传感器灵敏度、噪声及薄膜微观结构图像等，数据量约为3.99MB。