complex optical constants as functions of wavelengths, of the thin film of $S_1$ and $S_4$ deposited on silicon, by spectroscopic ellipsometry.
收藏DataCite Commons2025-05-01 更新2026-02-09 收录
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https://figshare.com/articles/dataset/complex_optical_constants_as_functions_of_wavelengths_of_the_thin_film_of_S_1_and_S_4_deposited_on_silicon_by_spectroscopic_ellipsometry_/28832450/1
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资源简介：
We obtained complex optical constants, viz. refractive indices and extinction coefficients as a function of wavelengths, of the thin film of $S_1$ and $S_4$ deposited on silicon, by spectroscopic ellipsometry. These values are useful in obtaining steady-state and transient-state behavior for OLED devices in the OLED simulation suite SETFOS.<br>
提供机构：
figshare
创建时间：
2025-04-21
