complex optical constants as functions of wavelengths, of the thin film of $S_1$ and $S_4$ deposited on silicon, by spectroscopic ellipsometry.
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We obtained complex optical constants, viz. refractive indices and extinction coefficients as a function of wavelengths, of the thin film of $S_1$ and $S_4$ deposited on silicon, by spectroscopic ellipsometry. These values are useful in obtaining steady-state and transient-state behavior for OLED devices in the OLED simulation suite SETFOS.<br>
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2025-04-21
