uMS Data on single crystalline Tungsten

The present files are raw micromechnical spectroscopy (µMS) data on single crystalline tungsten using a Bruker/Hysitron PI-85 Picoindenter inside a scanning electron microscope. The 'geometry.ods' file incorporates height (W), width (B) and length (L) of each experiment and the gathered raw data is collected in the *.zip files for each cantilever specimen, respectively.The raw data incorporates datachannels as per Bruker/Hysitron standard. A collection of the processed data can be found in 'processed_uMS_data.zip', with the individual files' datachannels as: channel frequency dynamic compliance dynamic compliance deviation phase shift phase shift deviation loss compliance loss compliance deviation storage compliance storage compliance deviation unit Hz m/N m/N rad rad m/N m/N m/N m/N Details on measurement protocol can be found in following open-access publications: Probing defect relaxation in ultra-fine grained Ta using micromechanical spectroscopy, 10.1016/j.actamat.2019.12.011 Revealing dynamic-mechanical properties of precipitates in a nanostructured thin film using micromechanical spectroscopy, 10.1557/s43577-023-00549-w