In Situ Transmission Electron Microscopy Data of Dislocations in Imperfectly Attached PbTe Nanocrystal Pairs

Dataset containing high resolution transmission electron microscopy data of imperfectly attached PbTe nanocrystals.  The data contains High Resolution TEM timeseries of images showing the annealing of of well defined b=a/2[110] edge dislocations in PbTe nanocrystal pairs viewed down the<001> zone axis.  Depending on the attachment facets of the particles, the dislocations anneal out at different rates.  In addition we performed geometric phase analysis on the images to visualize the strain fields surrounding the dislocation cores.  The raw image series, as well as drift corrected image series and all strain and rotation maps from geometric phase analysis are included in this dataset.  Further overlays of dislocation positions determined by geometric phase analysis overlaid on raw images are included to show the validity of dislocaiton tracking. Simple scripts used to analyze dislocation positions and overlay strain fields with TEM images for visualization and are included in this ...