Table S1
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资源简介：
Uncertainties in fitting parameters obtained from fitting X-ray reflectivity data collected
at room temperature for dry and water-swollen (75% RH) thin films of PVP on silicon wafers.
Scattering length density (ρ) and film thickness (l) of the PVP layer are included along with the
interfacial width between the film and substrate (wsubstrate) and the film and the free surface
(wsurface).
提供机构：
AIP Publishing
创建时间：
2026-04-14
