Raw data for "AFM as a Multimetrological Platform" Manuscript

Attached are the raw scanning probe microscopy data, collected with different instruments. Each instrument has its own data format and needs to be processed to represent the data properly. The processing often includes, false-colour scale assignment, tilt and rotational corrections, and levelling. After processing, the analysis helps extracting the necessary information from the data such as dimensional and electrical properties, which when calibrated can be presented as images, maps or spectroscopy graphs in respective units.