Edge illumination dark field signal generated by flour

This data set contains the results of an experiment described in "Efficient X-ray dark field contrast simulations using a condensed history approach". The sample was a 3D printed container with four holes of various shapes. The holes were filled with flour, a fine-grained powder that causes small-angle X-ray scattering, measurable as dark field using the edge illumination X-ray phase contrast setup. Acquisition scheme: dark current image to correct for detector noise flat field projections 21 mask steps of 5 micrometer to sample the IC in each pixel sample projections 21 mask steps of 5 micrometer to sample the IC in each pixel Postprocessing, i.e. gaussian fitting of the IC curves, was performed using the open source gpufit software (https://github.com/gpufit/Gpufit).