Probing the SEI on Si anodes using XRR

Operando XRR is used to probe in real time the formation of the SEI on model Si surfaces, thus providing valuable insights on the formation and evolution over the first few...采用原位X射线反射法（Operando XRR）实时探测模型硅基表面上固体电解质界面相（SEI）的形成过程，从而为其在最初的若干阶段中的形成与演化提供极具价值的科学见解。