Measuring the permittivity of Fused Silica with planar on-wafer structures up to 325 GHz

Name: Measuring the permittivity of Fused Silica with planar on-wafer structures up to 325 GHz
Creator: Department of Commerce
Published: 2025-12-20T03:37:06+08:00

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高频材料介电测量

毫米波集成电路材料表征

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https://catalog.data.gov/dataset/measuring-the-permittivity-of-fused-silica-with-planar-on-wafer-structures-up-to-325-ghz-5a3d7 数据链接链接失效反馈

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资源简介：

Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of...

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Department of Commerce

Measuring the permittivity of Fused Silica with planar on-wafer structures up to 325 GHz

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