Patent AT-E401578-T1: [Translated] METHOD FOR MEASURING SEMICONDUCTOR WAFERS USING AN OXIDE REINFORCED PROBE

Name: Patent AT-E401578-T1: [Translated] METHOD FOR MEASURING SEMICONDUCTOR WAFERS USING AN OXIDE REINFORCED PROBE
Creator: U.S. Department of Health & Human Services
Published: 2025-12-20T04:31:10+08:00

data.gov2025-12-20 收录

晶圆测试

电学测量

数据链接：

https://catalog.data.gov/dataset/patent-at-e401578-t1-translated-method-for-measuring-semiconductor-wafers-using-an-oxide-r 数据链接链接失效反馈

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资源简介：

A method of measuring at least one electrical property of a semiconductor wafer includes providing an elastically deformable and electrically conductive contact...

提供机构：

U.S. Department of Health & Human Services

Patent AT-E401578-T1: [Translated] METHOD FOR MEASURING SEMICONDUCTOR WAFERS USING AN OXIDE REINFORCED PROBE

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