Supplementary Online Material
收藏DataCite Commons2024-06-04 更新2024-08-18 收录
下载链接：
https://aip.figshare.com/articles/dataset/Supplementary_Online_Material/25887658
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资源简介：
Detailed sample fabrication and characterization procedure, XRR best-fit results, TEM sublayer intensity variation profiles, different frequency response regimes of σ_ac profiles, measured and deconvoluted SR-XPS spectra of core levels in 0.8A-0.8T NL
提供机构：
AIP Publishing
创建时间：
2024-05-23
