High energy characterization of interface for quantum applications
收藏ESRF Portal2027-01-01 更新2026-04-23 收录
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https://doi.esrf.fr/10.15151/ESRF-ES-1568754040
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资源简介：
We will use the new set of lenses to focus the beam to submicron size and then perform the novel High-Enrgy X-Ray Reflectivity Tomography on different sample
创建时间：
2027-01-01
