In-operando strain mapping of electrically pumped GeSn micro-ring lasers

We propose to employ in-operando Scanning X-ray Diffraction Microscopy (SXDM) to investigate the impact of the heat generated during their operation on the active layer lattice in electrically-pumped micro ring laser devices based on epitaxial GeSn/SiGeSn heterostructures. Our main goal is to follow, with time and spatial resolution, how the strain tensor of the epitaxial layer stack evolves under the heat generation/propagation processes occurring during the laser device operation.