Total Dose Effect Output Waveform of NC7SZ157

In order to study and simulate the port characteristics of the NC7SZ157 digital device multiplexer under total dose irradiation, the circuit board was fabricated and a total dose test was conducted at the Xinjiang Institute of Physics and Chemistry, where the board was irradiated at a dose rate of 50 krad(Si)/s. The test was set up with three dose points, which were 0 krad(Si), 50 krad(Si), and 100 krad(Si). For the test, input port I0 of the NC7SZ157 was set to '0', port I1 was set to '1' and port S was connected to a 40 KHz square wave signal. The waveforms of the NC7SZ157's output port Z were captured using a static test method with an oscilloscope. This resulted in a data file with 4 columns, the column labels are time (in s), voltage at 0 krad(Si) (in V), voltage at 50 krad(Si) (in V), and voltage at 100 krad(Si) (in V). It should be noted that the data may have errors due to testing. These errors do not affect the use of the data.