Semiconductor Wafer Defect Classification Dataset
收藏kaggle2026-01-30 更新2026-02-14 收录
下载链接：
https://www.kaggle.com/datasets/meruvakodandasuraj/semiconductor-wafer-defect-classification-dataset
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资源简介：
Industrial Sensor Data for PCA, Anomaly Detection, and ML-Based Quality Control
创建时间：
2026-01-30
