Stratigraphic layers of profiles EI and EVI.
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资源简介：
Selected sediment properties obtained from the sampled materials (KT: K-Ti-ratio; RX: Ruxton-ratio). Depth of samples given in cm below the modern surface. See S1 Fig and S1 and S2 Files for the detailed sedimentological record.
创建时间：
2020-09-11
