Ferroelectric phase transitions in NaNbO3 epitaxial films grown under tensile lattice strain

In the proposed experiment, we aim to detect and characterise ferroelectric phase transitions in tensile strained NaNbO3 thin films at low temperatures down to 20 K and to structurally investigate the corresponding phases in more detail. The influence of tensile stress on the phase transition will be investigated in more detail using two samples grown on two different substrates. For this purpose, in situ 3D X-ray diffraction and grazing incidence in-plane diffraction will be used.