Crystallographic data and refinement statistics for full-length and truncated hAQP5 S156E structures.
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a Values in brackets are for the highest resolution shellb Rsym = ΣhΣi|Ii(h)-I(h)>|/ ΣhΣiI(h), where Ii(h) is the ith measurement.c Rwork = Σh||F(h)obs|-|F(h)calc||/Σh|F(h)obs|d Rfree was calculated for 5% of reflections randomly excluded from the refinementCrystallographic data and refinement statistics for full-length and truncated hAQP5 S156E structures.
创建时间：
2015-12-03
