Data for: Adaptive, Symmetry-Informed Bayesian Metrology for Precise Quantum Technology Measurements
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Raw and Processed data from Adaptive, Symmetry-Informed Bayesian Metrology for Precise QuantumTechnology Measurements (2026). M. Overton, J. Rubio, N. Cooper, D. Baldolini, D. Johnson, J. Anders, and L. Hackermüller, Adaptive, Symmetry-Informed Bayesian Metrology for Precise Quantum Technology Measurements, Phys. Rev. Lett. 136, 140801 (2026). arXiv:2410.10615 [quant-ph].
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Zenodo创建时间：
2026-03-17
