Time-resolved XEOL and µLaue analysis implementation

We propose to expand the capabilities of the BM32 (within the PhD of B. Foschiani) to perform Time-Resolved measurements. The correlation of the µLaue and the TR-XEOL techniques is proposed to study µLEDs multiple quantum wells (MQW) grown on strained-engineered substrates involving different patterns. The impact of structural defects (etched sides, growth morphology, dislocations, relaxations) on the time-decay of the luminescence of the MQW will be quantified by high magnification mappings and statistical sampling on the µLED collections. The technical challenge of this proposal is to implement and test the tools to perform these measurements. The scientific goal is the understanding and the optimization of high-efficiency nitride emitters to reach the red emission, an objective not achieved yet in these materials (corresponding to the second market in semiconductor technology after Silicon).