Ellips — A FORTRAN simulation of a polarization-modulation ellipsometer

Abstract
Title of program: ELLIPS Catalogue number: ACXK Program obtainable from: CPC Program Library, Queen's University of Belfast, N. Ireland (see application form in this issue). Computer: Texas Instruments ASC II, Installation: NRL Operating system: OS4.021 Programming language used: FORTRAN IV High speed storage required: 20 500 words No. of bits in a word: 32 Overlay structure: none Peripherals used: Card reader, printer No. of cards in combined program and test deck: 1209 Card punching code: E...

Title of program: ELLIPS
Catalogue Id: ACXK_v1_0

Nature of problem
The problem treated is the analysis of the effect, on the detected AC signals, of imperfections in and misalignment of the optical components of a polarization-modulation ellipsometer. This permits correction of the values of psi and delta (characteristics of the sample surface) for systematic error, estimation of the uncertainty in the final result, and identification of the most significant sources of experimental error.

Versions of this program held in the CPC repository in Mendeley Data
ACXK_v1_0; ELLIPS; 10.1016/0010-4655(77)90015-7

This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)