Research data supporting "An approach to simultaneously test multiple devices for high-throughput production of thin-film electronics"
收藏官方服务：
资源简介：
This is data from developing new testing method under AUTOFLEX Project (EP/L505201/1). This includes Thin-Film Transistor device electrical characterization, Ring Oscillator circuit electrical characterization and circuit simulation.
创建时间：
2021-04-30
