The XRD diffraction patterns of Ce(Pr,Sm)O2-s samples
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The dataset includes XRD diffraction patterns of Ce(Pr,Sm)O2-s samples of various stoichiometries of Pr and Sm dopants. Samples were produced using aqueous soft chemistry methods (microemulsion method).
"The phase composition of the investigated materials was analysed using the X-ray diffraction method (XRD) by an X'Pert Pro MPD Philips diffractometer with Cu Kα (1.542 Å) radiation at room temperature." (Cyfrowy identyfikator dokumentu elektronicznego (otwiera się w nowej karcie)10.1016/j.ijhydene.2020.07.146)
提供机构:
Patryk Błaszczak



