Research data supporting "Time-resolved open-circuit conductive atomic force microscopy for direct electromechanical characterisation"
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https://www.repository.cam.ac.uk/handle/1810/308791
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资源简介：
These files contain the original AFM files and outputs of the experiments described in the paper. As such they were obtained using the Bruker Icon AFM and have either two dimensional scans containing topography and current at different biases when scanning atop nanowires, or current vs. deflection (or height) obtained as the AFM cantilever was driven towards the sample. To be viewed using AFM software or any data software in case of txt files.
提供机构：
Apollo - University of Cambridge Repository
创建时间：
2020-06-05
