Supplementary material for the publication: "Combining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer"
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下载链接：
https://zenodo.org/record/11229836
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资源简介：
This dataset contains postprocessed data for the publication „Combining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer“.
创建时间：
2024-07-05
